KMID : 0385520070200060483
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Analytical Science & Technology 2007 Volume.20 No. 6 p.483 ~ p.487
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Electrochemistry of bis(1,10-phenanthroline)copper(¥±)-sodium dodecyl sulfate solution in the presence of MgCl©ü
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Ko Young-Chun
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Abstract
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Electrochemistry of 1.0 mM bis(1,10-phenanthroline)copper(¥±) (Cu(ph)©ü ©÷?) in 100 mM NaCl solution including 27 mM MgCl©ü with and without sodium dodecyl sulfate (SDS) is studied. In the presence of SDS, Epa and E©û/©ü of Cu(ph)©ü ©÷? by adding Mg©÷? shifts to a positive direction compared to the SDS free. The intersection of two lines on ¥ÄEp vs -log[SDS] plot is determined as a critical micelle concentration (CMC). When Mg©÷? is added, it seems that the double layer became more compact. And the formation of micelles is retarded.
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KEYWORD
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bis(1, 10-phenanthroline)copper(¥±), sodium dodecyl sulfate, critical micelle concentration, ionic strength, double layer
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